X-Ray Ion Mobility Spectrometer
For the ionization of gaseous samples, most ion mobility spectrometers employ radioactive ionization sources, e.g. containing 63Ni or 3H. Besides legal restrictions, radioactive materials have the disadvantage of a constant radiation with predetermined intensity.
The aim of this research project is the realization and characterization of an X-ray IMS. Therefore, the 3H-source of our previously described compact high resolution IMS was replaced by a commercially available X-ray source. The realized setup maintains the high resolving power of R = 100 at a drift length of 75 mm and shows very good detection limits in the low pptv-range.